Available Equipment

NanoFACT currently has the following pieces of equipment (only equipment > 100k € is mentioned).

X-ray Spectroscopy and imaging:

BIO-XPS JEOL JPS-9200


Specifications of the instrument:


Locations and contact:

Location : 7028, Contact: Barend van Lagen

Recent publications:

JEOL JAMP-9500F Scanning Auger Microprobe (SAM)


Specifications of the instrument:


Locations and contact:

Location : 0043, Contact: Sidharam Pujari

Recent publications:

Atomic Force Microscopy – Infrared Spectroscopy (AFM-IR):

Bruker NanoIR3


Specifications of the instrument:


Locations and contact:

Location: 0091, Contact: Francesco Simone Ruggeri

Recent publications:

Bruker NanoIR3 in Liquid


Specifications of the instrument:


Locations and contact:

Location: 0091, Contact: Francesco Simone Ruggeri

Recent publications:

Atomic Force Microscopy (AFM):

Park Systems AFM


Specifications of the instrument:


Locations and contact:

Location: 0044, Contact: Francesco Simone Ruggeri

Recent publications:

Asylum AFM MFP-3D


Specifications of the instrument:


Locations and contact:

Location: 6039, Contact: Francesco Simone Ruggeri

Recent publications:

Bruker Multimode VIII


Specifications of the instrument:


Locations and contact:

Location: 0044 & 6039, Contact: Francesco Simone Ruggeri

Recent publications:

Bruker Multimode VIII HR


Specifications of the instrument:


Locations and contact:

Location: 0044 & 6039, Contact: Francesco Simone Ruggeri

Recent publications:

JPK Force Robot 300


Specifications of the instrument:


Locations and contact:

Location: 6039, Contact: Francesco Simone Ruggeri

Recent publications:

Surface-sensitive and micron-scale resolution Vibrational spectroscopy:

Bruker ATR-IR TENSOR II


Specifications of the instrument:


Locations and contact:

Location: 7080, Contact: Francesco Simone Ruggeri

Recent publications:

Bruker ATR-IR TENSOR II


Specifications of the instrument:


Locations and contact:

Location: 7080, Contact: Francesco Simone Ruggeri

Recent publications:

Bruker Hyperion 2000 IR-microscope

Specifications of the instrument:


Locations and contact:

Location: 7080, Contact: Francesco Simone Ruggeri

Recent publications:

Other surface-sensitive general instrumentation available at ORC & PCC:

Accurion EP4 Spectroscopic imaging ellipsometry


Specifications of the instrument:


Locations and contact:

Location: 7029, Contact: Sidharam Pujari

Recent publications:

Drop Shape Analyzer DSA30 (KRÜSS)


Specifications of the instrument:

a. conic section

  b. polynom

  c. circle

  d. Young-Laplace

  e. height-width

a. Advancing

b. Receding

c. Static

d. dynamic 


Locations and contact:

Location: 7082, Contact: Sidharam Pujari

Recent publications: